John Lee

John Lee

Areas of Expertise

  • Computational electromagnetics (CEM)
  • EM modeling, simulation, measurement, and analysis
  • Computer-Aided Design (CAD)
  • Optimization theory
  • Signal processing
  • Compressive sensing (CS)

Background and Current Work

John Lee joined Riverside Research in December 2008. He has 13 years of experience in electromagnetic modeling and simulation and the application of optimization theory to forward and inverse scattering problems for various government customers. He supports Riverside Research’s electromagnetics research in software integration and testing as well as simulation development and data analysis.  He provides CAD and CEM tool expertise to deliver efficient and high-quality electromagnetic models and predictions that have been recognized by customers for their unprecedented accuracy. He has led engagement modeling, signature prediction, and measurement analysis efforts for several high-visibility experiments and programs. He has also participated in numerous measurement campaigns of both engineering and production hardware and has practical experience with conducting measurements at instrumentation radar facilities. John previously contributed to the research, design, implementation, and testing of novel optimization techniques and supported the development of low-level hierarchical linear algebra routines.

Education, Awards, and Recognition

John is currently pursuing his PhD at the Air Force Institute of Technology with a focus on electromagnetic applications of compressive sensing. He received an MS in electrophysics from New York University Tandon School of Engineering and a BS in electrical and computer systems engineering from Rensselaer Polytechnic Institute.